Feature Extraction for Electronic Equipment Manufacturing
نویسندگان
چکیده
The authors have been involved in the implementation of a total quality control project in a communications equipment company, whose products are mounted and tested in a manufacturing plant controlled by an IBM Token Ring LAN. The first implementation of total quality control project was an ATE (Automatic Test Equipment) LAN node that runs a program of verification for single-channel and multichannel electronic amplifiers. The last implementation is an automated inspection LAN node based on artificial vision. Miguel Angel Dominguez Electronic Technology Department and Applied Electronics Institute University of Vigo 36200 Vigo, Spain. e-mail: [email protected] Fax:+34-986-469547 Tel: +34-986-8 12 143 supported in its performance for a RF analyser connected to it through an IEEE 488 bus [5]. The last implementation is an automated inspection LAN node to detect the missing of SMT and non SMT components mounted in the electronic cards of above mentioned amplifiers. This LAN node for automated inspection is based on artificial vision [6] [7] and will be called MVI (Machine-Vision Inspection). The first implementation is a case study of online/postprocess inspection because the ATE LAN node immediately follows the production process, whereas the last one based on artificial vision (MVI) is the type of onlinelin-process inspection [I], and therefore can be used in different stages along the mounting shop floor of the communications enterprise [8].
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